30 J cm2 at 532 nm, 10 ns, 10 Hz, 0. 4 mm"> 30 J cm2 at 532 nm, 10 ns, 10 Hz, 0. 4 mm"> 30 J cm2 at 532 nm, 10 ns, 10 Hz, 0. 4 mm"> T-W40510T1 - Ø1/2" Textured Broadband Antireflective Window, UVFS, AR Range: 400 - 1100 nm, t = 1.0 mm product-series_kit-base • Easy Operation with Help – armorenviro.com
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T-W40510T1 - Ø1/2" Textured Broadband Antireflective Window, UVFS, AR Range: 400 - 1100 nm, t = 1.0 mm product-series_kit-base • Easy Operation with Help

USD179.00 USD215.00
SKU 1754316213
4.5

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Ships within 48 hours · Estimated delivery Aug 31 - Sep 5

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Description

• Easy Operation with Help Mode

The T-DRV304 Differential Micrometer uses a unique mechanism that converts a relatively large displacement into a relatively small displacement of the center fine adjustment spindle

Oxygen index of 35 per ASTM D 2863

Fluke 177 True RMS DMM is included

T-W40510T1 - Ø1/2" Textured Broadband Antireflective Window, UVFS, AR Range: 400 - 1100 nm, t = 1.0 mm product-series_kit-base • Easy Operation with HelpT W40510T1 1 2" Textured Broadband Antireflective Window, UVFS, AR Range: 400 1100 nm, t = 1. 0 mm Product Drawing 1 2" and 1" Versions Available <0. 25% Average Reflectance Per Surface 98% Absolute Transmission from 400 to 1100 nm Ideal for UV through NIR Applications Requiring Long Term Beam Stability High Resistance to Laser Induced Damage Damage Threshold Specifications Item # Suffix Damage Threshold T1 >30 J cm2 at 532 nm, 10 ns, 10 Hz, 0. 4 mm

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  • Final sale items are not eligible for returns or exchanges.
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